AIGaAs/GaAs Heterojunction. An N-AIGaAs/p-GaAs heterojunction operates at the junction temperature of 300 K, kT = 25.9 meV. The doping concentration is N = 1.35x10^18 cm^(-3) on the p-side and N = 1.05x10^18 cm^(-3) on the N-side. Assume that the effective density of states for the GaAs and AIGaAs are given by Nc = 7.10^17 cm^(-3) for the conduction band of AIGaAs and Nv = 9.10^17 cm^(-3) for the valence band of GaAs. The bandgaps are given by Eg = 1.8 eV for AIGaAs and Egp = 1.42 eV for GaAs. Assume that the conduction band edge discontinuity is given by E = 0.67Eg where Eg is the difference between the AlGaAs and GaAs bandgaps. For GaAs, the electron and hole mobility values are 2400 cm^2/(V.s) and 160 cm^2/(V.s), respectively, and the direct recombination coefficient is B = 2.10^(-10) [cm^3/s]. The intrinsic carrier density in GaAs is n = 2.10^6 cm^(-3).
(a) Find the Fermi levels at thermal equilibrium for the materials on both sides of the junction with respect to either the conduction or the valence band edges.
(b) Find the built-in potential.
(c) Sketch the band diagram of the junction and the quasi-Fermi levels when a forward voltage of 1.1 V is applied across the junction. Label the energy values. There is no need to specify the dimensions along x.
(d) Assume a forward bias of 1.1 V is applied across the junction. Find the hole diffusion current density at the boundary between the depletion and quasi-neutral regions on the p side (x).
N-AIGaAs
p-GaAs
-XN
0
Xp
x